Publications

Methods of forming stressed channel regions for a FinFET semiconductor device and the resulting device

Abstract

METHODS OF FORMING STRESSED CHANNEL REGIONS FOR A FINFET SEMCONDUCTOR DEVICE AND THE RESULTING DEVICE

Date
December 15, 2015
Authors
X Cai, R Xie, AP Jacob, WP Maszara, K Cheng, A Khakifirooz
Inventors
Xiuyu Cai, Ruilong Xie, Ajey P Jacob, Witold P Maszara, Kangguo Cheng, Ali Khakifirooz
Patent_office
US
Patent_number
9214553
Application_number
14200952