Abstract

Magnetic and structural properties of a Ge 0.96 Mn 0.04 thin film grown on Si has been investigated by transmission electron microscopy and superconducting quantum interference device. Tadpole shaped coherent GeMn clusters induced by spinodal decomposition were revealed in the film. Although these coherent clusters are dominant, Mn 5 Ge 3 precipitates can be still detectable, contributing to a complex ferromagnetism. The Ge buffer layer, by relieving the misfit strain between Si and Ge, can significantly reduce the density of lattice defects in the subsequent GeMn layer. Our findings unveil a particular morphology of GeMn clusters, which would contribute to better understand the GeMn system.

Date

February 1, 2010

Authors

Yong Wang, Faxian Xiu, Jin Zou, Kang L Wang, Ajey P Jacob

Journal

Applied Physics Letters

Volume

96

Issue

5

Publisher

AIP Publishing