Abstract

G06V10/443—Local feature extraction by analysis of parts of the pattern, eg by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, eg of connected components by matching or filtering

Metadata

publication

US Patent 11,775,617, 2023

year

2023

publication date

2023/10/3

authors

A Jaiswal, Y Wu, P Natarajan, P Natarajan

link

https://patents.google.com/patent/US11775617B1/en

inventors

Ayush Jaiswal, Yue Wu, Pradeep Natarajan, Premkumar Natarajan

patent_office

US

patent_number

11775617

application_number

17201358